Onto innovation wins 2022 best of west award for atlas v optical critical dimension metrology tool

SAN FRANCISCO, Calif. – July 13, 2022 – The Atlas V optical critical dimension metrology tool from Onto Innovation, Inc. has won the 2022 Best of West award, SEMI and Semiconductor Digest announced today at SEMICON West 2022 Hybrid, July 12-14 at the Moscone Center in San Francisco. Onto Innovation is a leader in process control, including un-patterned wafer quality, 3D metrology, macro defect inspection of wafers and packages, metal interconnect composition, factory analytics, and lithography for advanced semiconductor packaging.